Performance tests of depleted CMOS sensors for application at HL-LHC / Christian Johann Riegel. Wuppertal, 27. April 2018
Inhalt
- Introduction
- Standard Model and High Energy Physics experiments
- Particle detection with silicon detectors
- Silicon properties
- The pn–junction
- Interaction of ionising particles with matter
- Charge collection and Segmentation
- Complementary Metal-Oxide Semiconductor (CMOS) technology
- Radiation damage of semiconductor sensors
- Radiation damage in the bulk - NIEL damage
- Radiation-induced surface damage - IEL damage
- ATLAS semiconductor tracking system
- The new ATLAS Inner Tracker (ITk)
- Detector technologies
- TowerJazz Investigator
- ALICE ITS Upgrade
- TowerJazz [180]nm technology
- Investigator chip and pixel design
- Modified process for enhanced depletion
- ATLAS TowerJazz Investigator test setup and data analysis procedure
- ATLAS TowerJazz Investigator test setup
- Data analysis procedure
- Robustness of fit function against noise
- Noise of the external readout chain
- Linearity of external readout chain
- Summary
- Signal characterisation of the Standard Process
- Validation of the chosen working point
- Correlation of deposited energy and signal size
- Transfer function of the internal source follower
- Linearity test using monochromatic fluorescence lines
- Performance of the Standard Process before irradiation
- Sensor performance after irradiation
- Irradiation campaigns at the TRIGA reactor in Ljubljana
- Gain and charge collection after irradiation
- Signal rise time after irradiation
- Efficiency measurements – Standard Process
- Summary
- Performance of the Modified Process
- Correlation of deposited energy and signal size
- Performance of the Modified Process before irradiation
- Sensor performance after irradiation
- Gain and charge collection after irradiation
- Signal rise time after irradiation
- Hit rates depending on pixel position
- Efficiency measurements – Modified Process
- Charge collection
- Summary
- Impact of the n-layer implant doping concentration
- Summary and Outlook
- Bibliography
- List of Abbreviations
- List of Figures
- List of Tables
- Additional results and information